Structures

VkPhysicalDeviceRepresentativeFragmentTestFeaturesNV

Structure describing the representative fragment test features that can be supported by an implementation

The VkPhysicalDeviceRepresentativeFragmentTestFeaturesNV structure is defined as:

typedef struct VkPhysicalDeviceRepresentativeFragmentTestFeaturesNV {
    VkStructureType sType;
    void* pNext;
    VkBool32 representativeFragmentTest;
} VkPhysicalDeviceRepresentativeFragmentTestFeaturesNV;

This structure describes the following feature:

  • sType is a VkStructureType value identifying this structure.
  • pNext is NULL or a pointer to a structure extending this structure.
  • representativeFragmentTest indicates whether the implementation supports the representative fragment test. See Representative Fragment Test.

If the VkPhysicalDeviceRepresentativeFragmentTestFeaturesNV structure is included in the pNext chain of the VkPhysicalDeviceFeatures2 structure passed to vkGetPhysicalDeviceFeatures2, it is filled in to indicate whether each corresponding feature is supported. VkPhysicalDeviceRepresentativeFragmentTestFeaturesNV can also be used in the pNext chain of VkDeviceCreateInfo to selectively enable these features.

Valid Usage (Implicit)

VUID-VkPhysicalDeviceRepresentativeFragmentTestFeaturesNV-sType-sType

sType must be VK_STRUCTURE_TYPE_PHYSICAL_DEVICE_REPRESENTATIVE_FRAGMENT_TEST_FEATURES_NV