VkSampleLocationsInfoEXT

The VkSampleLocationsInfoEXT structure is defined as:

typedef struct VkSampleLocationsInfoEXT {
    VkStructureType sType;
    const void* pNext;
    VkSampleCountFlagBits sampleLocationsPerPixel;
    VkExtent2D sampleLocationGridSize;
    uint32_t sampleLocationsCount;
    const VkSampleLocationEXT* pSampleLocations;
} VkSampleLocationsInfoEXT;

• sType is a VkStructureType value identifying this structure.
• pNext is NULL or a pointer to a structure extending this structure.
• sampleLocationsPerPixel is a VkSampleCountFlagBits value specifying the number of sample locations per pixel.
• sampleLocationGridSize is the size of the sample location grid to select custom sample locations for.
• sampleLocationsCount is the number of sample locations in pSampleLocations.
• pSampleLocations is a pointer to an array of sampleLocationsCount VkSampleLocationEXT structures.

This structure can be used either to specify the sample locations to be used for rendering or to specify the set of sample locations an image subresource has been last rendered with for the purposes of layout transitions of depth/stencil images created with VK_IMAGE_CREATE_SAMPLE_LOCATIONS_COMPATIBLE_DEPTH_BIT_EXT.

The sample locations in pSampleLocations specify sampleLocationsPerPixel number of sample locations for each pixel in the grid of the size specified in sampleLocationGridSize. The sample location for sample i at the pixel grid location (x,y) is taken from pSampleLocations[(x + y × sampleLocationGridSize.width) × sampleLocationsPerPixel + i].

If the render pass has a fragment density map, the implementation will choose the sample locations for the fragment and the contents of pSampleLocations may be ignored.